Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. A Highly Testable 1-out-of-3 CMOS Checker. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 279-286, IEEE Computer Society, 1993.
Abstract is missing.