Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults

Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults. J. Electronic Testing, 6(1):7-22, 1995. [doi]

Abstract

Abstract is missing.