Non-robust delay test pattern generation based on stuck-at TPG - researchr publication authors

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Volker Meyer, Walter Anheier, Arne Sticht. Non-robust delay test pattern generation based on stuck-at TPG. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 1007-1010, IEEE, 2001. [doi]

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