Volker Meyer, Walter Anheier, Arne Sticht. Non-robust delay test pattern generation based on stuck-at TPG. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 1007-1010, IEEE, 2001. [doi]
@inproceedings{MeyerAS01, title = {Non-robust delay test pattern generation based on stuck-at TPG}, author = {Volker Meyer and Walter Anheier and Arne Sticht}, year = {2001}, doi = {10.1109/ICECS.2001.957645}, url = {https://doi.org/10.1109/ICECS.2001.957645}, researchr = {https://researchr.org/publication/MeyerAS01}, cites = {0}, citedby = {0}, pages = {1007-1010}, booktitle = {Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001}, publisher = {IEEE}, isbn = {0-7803-7057-0}, }