A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

Christopher Michael, Christopher J. Abel, C. S. Teng. A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 330-333, IEEE Computer Society, 1993. [doi]

Abstract

Abstract is missing.