Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 417-422, IEEE Computer Society, 2002. [doi]
@inproceedings{MichinishiYOKH02,
title = {CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply},
author = {Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250417abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/MichinishiYOKH02},
cites = {0},
citedby = {0},
pages = {417-422},
booktitle = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1825-7},
}