Hiroyuki Michinishi - researchr alias

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Viewing Publication 1 - 9 from 9

2007

Detection of CMOS Open Node Defects by Frequency AnalysisHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ieicet, 90-D(3):685-687, 2007. [doi]

2004

Model analysis of coronary hemodynamics incorporating autoregulationMitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya. scjapan, 35(14):21-31, 2004. [doi]

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC ComponentHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ieicet, 87-D(3):551-556, 2004. [doi]

2003

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current TestHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ats 2003: 406-411 [doi]

2002

CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power SupplyHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. ats 2002: 417-422 [doi]

1997

Testing for the programming circuit of LUT-based FPGAsHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara. ats 1997: 242-247 [doi]

1996

A Test Methodology for Interconnect Structures of LUT-based FPGAsHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara. ats 1996: 68-74 [doi]

1995

Universal test complexity of field-programmable gate arraysTomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto. ats 1995: 259-265 [doi]

The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five OutputsTokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto. ieicet, 78-D(7):874-881, 1995. [doi]

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