Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 406-411, IEEE Computer Society, 2003. [doi]
Abstract is missing.