Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 406-411, IEEE Computer Society, 2003. [doi]
@inproceedings{MichinishiYOKH03,
title = {Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test},
author = {Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510406abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/MichinishiYOKH03},
cites = {0},
citedby = {0},
pages = {406-411},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}