CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component - researchr publication

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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Transactions, 87-D(3):551-556, 2004. [doi]

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