CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Transactions, 87-D(3):551-556, 2004. [doi]

Authors

Hiroyuki Michinishi

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Tokumi Yokohira

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Takuji Okamoto

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Toshifumi Kobayashi

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Tsutomu Hondo

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