Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara. Testing for the programming circuit of LUT-based FPGAs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 242-247, IEEE Computer Society, 1997. [doi]
Abstract is missing.