Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara. Testing for the programming circuit of LUT-based FPGAs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 242-247, IEEE Computer Society, 1997. [doi]
@inproceedings{MichinishiYOIF97,
title = {Testing for the programming circuit of LUT-based FPGAs},
author = {Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Tomoo Inoue and Hideo Fujiwara},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090242abs.htm},
tags = {rule-based, testing, programming},
researchr = {https://researchr.org/publication/MichinishiYOIF97},
cites = {0},
citedby = {0},
pages = {242-247},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}