J. Michl, A. Grill, Dieter Claes, Gerhard Rzepa, Ben Kaczer, D. Tinten, I. Radu, Tibor Grasser, M. WaltT. Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.