Sergey Mikhtonyuk, Maksim Davydov, Roman Hwang, Dmitry Shcherbin. IEEE 1500 compliant test wrapper generation tool for VHDL models. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 495-499, IEEE, 2010. [doi]
@inproceedings{MikhtonyukDHS10,
title = {IEEE 1500 compliant test wrapper generation tool for VHDL models},
author = {Sergey Mikhtonyuk and Maksim Davydov and Roman Hwang and Dmitry Shcherbin},
year = {2010},
doi = {10.1109/EWDTS.2010.5742069},
url = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2010.5742069},
researchr = {https://researchr.org/publication/MikhtonyukDHS10},
cites = {0},
citedby = {0},
pages = {495-499},
booktitle = {2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010},
publisher = {IEEE},
isbn = {978-1-4244-9555-9},
}