Evelyn Mintarno, Joelle Skaf, Rui Zheng, Jyothi Velamala, Yu Cao, Stephen P. Boyd, Robert W. Dutton, Subhasish Mitra. Optimized self-tuning for circuit aging. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 586-591, IEEE, 2010. [doi]
Abstract is missing.