Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois. Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing, 9(1-2):43-57, 1996. [doi]

Authors

Salvador Mir

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Marcelo Lubaszewski

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Bernard Courtois

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