Salvador Mir, Marcelo Lubaszewski, Bernard Courtois. Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing, 9(1-2):43-57, 1996. [doi]
@article{MirLC96,
title = {Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets},
author = {Salvador Mir and Marcelo Lubaszewski and Bernard Courtois},
year = {1996},
doi = {10.1007/BF00137564},
url = {http://dx.doi.org/10.1007/BF00137564},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/MirLC96},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {9},
number = {1-2},
pages = {43-57},
}