On-chip testing of embedded transducers

Salvador Mir, Libor Rufer, Bernard Courtois. On-chip testing of embedded transducers. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 463, IEEE Computer Society, 2004. [doi]

Authors

Salvador Mir

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Libor Rufer

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Bernard Courtois

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