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Comparing different solutions for testing resistive defects in low-power SRAMs

Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, Matteo Sonza Reorda. Comparing different solutions for testing resistive defects in low-power SRAMs. In LATS. pages 1-6, 2021. [doi]

Authors

Nunzio Mirabella

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Michelangelo Grosso

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Giovanna Franchino

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Salvatore Rinaudo

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Ioannis Deretzis

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Antonino La Magna

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Matteo Sonza Reorda

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