José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman. Test Reuse at System Level. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 318-319, IEEE Computer Society, 1998. [doi]
@inproceedings{MirandaDDAM98,
title = {Test Reuse at System Level},
author = {José M. Miranda and Scott Davidson and Peter Dziel and Saman Adham and Steve Millman},
year = {1998},
url = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360318.pdf},
tags = {testing, reuse},
researchr = {https://researchr.org/publication/MirandaDDAM98},
cites = {0},
citedby = {0},
pages = {318-319},
booktitle = {16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8436-4},
}