Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow. FALCON: Rapid statistical fault coverage estimation for complex designs. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]
Abstract is missing.