In-depth soft error vulnerability analysis using synthetic benchmarks

Shahrzad Mirkhani, Balavinayagam Samynathan, Jacob A. Abraham. In-depth soft error vulnerability analysis using synthetic benchmarks. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

Abstract

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