Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta. A design flow to maximize yield/area of physical devices via redundancy. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]
@inproceedings{Mirza-AghatabarBG12,
title = {A design flow to maximize yield/area of physical devices via redundancy},
author = {Mohammad Mirza-Aghatabar and Melvin A. Breuer and Sandeep K. Gupta},
year = {2012},
doi = {10.1109/TEST.2012.6401582},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401582},
researchr = {https://researchr.org/publication/Mirza-AghatabarBG12},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-1594-4},
}