Yuichiro Mitani, Tatsuya Suzuki, Yohei Miyaki. Re-Consideration of Correlation Between Interface States and Bulk Traps Using Cryogenic Measurement. In Yuichi Nakamura 0002, Yu Wang 0002, editors, Proceedings of the 30th Asia and South Pacific Design Automation Conference, ASPDAC 2025, Tokyo, Japan, January 20-23, 2025. pages 1432-1437, ACM, 2025. [doi]
Abstract is missing.