Sanjoy Mitra, Debaprasad Das. An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic. J. Electronic Testing, 36(3):327-342, 2020. [doi]
@article{MitraD20,
title = {An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic},
author = {Sanjoy Mitra and Debaprasad Das},
year = {2020},
doi = {10.1007/s10836-020-05880-7},
url = {https://doi.org/10.1007/s10836-020-05880-7},
researchr = {https://researchr.org/publication/MitraD20},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {36},
number = {3},
pages = {327-342},
}