Rupali Mitra, Debesh K. Das, Bhargab B. Bhattacharya. On Designing Robust Path-Delay Fault Testable Combinational Circuits Based on Functional Properties. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 202-207, IEEE, 2014. [doi]
Abstract is missing.