Subhasish Mitra, Edward J. McCluskey. Design Diversity for Concurrent Error Detection in Sequential Logic Circuts. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 178-183, IEEE Computer Society, 2001. [doi]
@inproceedings{MitraM01, title = {Design Diversity for Concurrent Error Detection in Sequential Logic Circuts}, author = {Subhasish Mitra and Edward J. McCluskey}, year = {2001}, url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220178abs.htm}, tags = {logic, design}, researchr = {https://researchr.org/publication/MitraM01}, cites = {0}, citedby = {0}, pages = {178-183}, booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1122-8}, }