Fault Escapes in Duplex Systems

Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey. Fault Escapes in Duplex Systems. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 453-458, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.