Detection of Interconnect Open Faults with Unknown Values by Ramp Voltage Application

Yukiya Miura. Detection of Interconnect Open Faults with Unknown Values by Ramp Voltage Application. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 55-62, IEEE, 2006. [doi]

Abstract

Abstract is missing.