Yukiya Miura, Jiro Kato. Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 410-418, IEEE Computer Society, 2006. [doi]
Abstract is missing.