Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada. Relation between internal terminal voltage and immunity behavior of LDO regulator circuits. In 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015. pages 143-146, IEEE, 2015. [doi]
Abstract is missing.