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Yousuke Miyake, Yasuo Sato, Seiji Kajihara. On-Chip Delay Measurement for In-Field Test of FPGAs. In 24th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2019, Kyoto, Japan, December 1-3, 2019. pages 130-137, IEEE, 2019. [doi]