Yousuke Miyake, Yasuo Sato, Seiji Kajihara. On-Chip Delay Measurement for In-Field Test of FPGAs. In 24th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2019, Kyoto, Japan, December 1-3, 2019. pages 130-137, IEEE, 2019. [doi]
No references recorded for this publication.
No citations of this publication recorded.