Yousuke Miyake, Yasuo Sato, Seiji Kajihara. On-Chip Delay Measurement for In-Field Test of FPGAs. In 24th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2019, Kyoto, Japan, December 1-3, 2019. pages 130-137, IEEE, 2019. [doi]
@inproceedings{MiyakeSK19-0,
title = {On-Chip Delay Measurement for In-Field Test of FPGAs},
author = {Yousuke Miyake and Yasuo Sato and Seiji Kajihara},
year = {2019},
doi = {10.1109/PRDC47002.2019.00043},
url = {https://doi.org/10.1109/PRDC47002.2019.00043},
researchr = {https://researchr.org/publication/MiyakeSK19-0},
cites = {0},
citedby = {0},
pages = {130-137},
booktitle = {24th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2019, Kyoto, Japan, December 1-3, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4961-5},
}