Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant Monitor

Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura. Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant Monitor. IEEE Trans. VLSI Syst., 24(11):3282-3295, 2016. [doi]

Abstract

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