J. Miyamoto, N. Ohtsuka, K. Imamiya, N. Tomita, Y. Iyama. Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 540-547, IEEE Computer Society, 1991.
Abstract is missing.