Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara. A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 197-202, IEEE, 2012. [doi]
Abstract is missing.