Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy. A Method of Static Test Compaction Based on Don t Care Identification. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 392-395, IEEE Computer Society, 2002. [doi]
Abstract is missing.