The following publications are possibly variants of this publication:
- XID: Don t care identification of test patterns for combinational circuitsKohei Miyase, Seiji Kajihara. tcad, 23(2):321-326, 2004. [doi]
- Don t Care Identification and Statistical Encoding for Test Data CompressionSeiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy. ieicet, 87-D(3):544-550, 2004. [doi]
- Don t-Care Identification on Specific Bits of Test PatternsKohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy. iccd 2002: 194-199 [doi]
- Test Data Compression Using Don?t-Care Identification and Statistical EncodingSeiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy. ats 2002: 67 [doi]
- Test Data Compression Using Don t-Care Identification and Statistical EncodingSeiji Kajihara, Kenjiro Taniguchi, Irith Pomeranz, Sudhakar M. Reddy. delta 2002: 413-416 [doi]