D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Michiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama. Correlation method of circuit-performance and technology fluctuations for improved design reliability. In Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan. pages 39-44, ACM, 2001. [doi]
Abstract is missing.