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Impact of Reabsorption of Spilled Knowledge on Patent Value

T. Miyazaki, Ryo Takemura, T. Harada, Noritomo Ouchi. Impact of Reabsorption of Spilled Knowledge on Patent Value. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2020, Singapore, December 14-17, 2020. pages 354-358, IEEE, 2020. [doi]

Authors

T. Miyazaki

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Ryo Takemura

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T. Harada

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Noritomo Ouchi

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