T. Miyazaki, Ryo Takemura, T. Harada, Noritomo Ouchi. Impact of Reabsorption of Spilled Knowledge on Patent Value. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2020, Singapore, December 14-17, 2020. pages 354-358, IEEE, 2020. [doi]
No references recorded for this publication.
No citations of this publication recorded.