T. Miyazaki, Ryo Takemura, T. Harada, Noritomo Ouchi. Impact of Reabsorption of Spilled Knowledge on Patent Value. In IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2020, Singapore, December 14-17, 2020. pages 354-358, IEEE, 2020. [doi]
@inproceedings{MiyazakiTHO20,
title = {Impact of Reabsorption of Spilled Knowledge on Patent Value},
author = {T. Miyazaki and Ryo Takemura and T. Harada and Noritomo Ouchi},
year = {2020},
doi = {10.1109/IEEM45057.2020.9309832},
url = {https://doi.org/10.1109/IEEM45057.2020.9309832},
researchr = {https://researchr.org/publication/MiyazakiTHO20},
cites = {0},
citedby = {0},
pages = {354-358},
booktitle = {IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2020, Singapore, December 14-17, 2020},
publisher = {IEEE},
isbn = {978-1-5386-7220-4},
}