ECO-Map: Technology remapping for post-mask ECO using simulated annealing

Nilesh A. Modi, Malgorzata Marek-Sadowska. ECO-Map: Technology remapping for post-mask ECO using simulated annealing. In 26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings. pages 652-657, IEEE, 2008. [doi]

@inproceedings{ModiM08,
  title = {ECO-Map: Technology remapping for post-mask ECO using simulated annealing},
  author = {Nilesh A. Modi and Malgorzata Marek-Sadowska},
  year = {2008},
  doi = {10.1109/ICCD.2008.4751930},
  url = {http://dx.doi.org/10.1109/ICCD.2008.4751930},
  researchr = {https://researchr.org/publication/ModiM08},
  cites = {0},
  citedby = {0},
  pages = {652-657},
  booktitle = {26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings},
  publisher = {IEEE},
}