ECO-Map: Technology remapping for post-mask ECO using simulated annealing

Nilesh A. Modi, Malgorzata Marek-Sadowska. ECO-Map: Technology remapping for post-mask ECO using simulated annealing. In 26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings. pages 652-657, IEEE, 2008. [doi]

Abstract

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