A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level - researchr publication authors

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Nicola Modolo, Andrea Minetto, Carlo De Santi, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini. A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-5, IEEE, 2021. [doi]

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