Nicola Modolo, Andrea Minetto, Carlo De Santi, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini. A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{ModoloMSSSPMZM21,
title = {A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level},
author = {Nicola Modolo and Andrea Minetto and Carlo De Santi and Luca Sayadi and Sebastien Sicre and Gerhard Prechtl and Gaudenzio Meneghesso and Enrico Zanoni and Matteo Meneghini},
year = {2021},
doi = {10.1109/IRPS46558.2021.9405142},
url = {https://doi.org/10.1109/IRPS46558.2021.9405142},
researchr = {https://researchr.org/publication/ModoloMSSSPMZM21},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021},
publisher = {IEEE},
isbn = {978-1-7281-6893-7},
}