Nicola Modolo, Carlo De Santi, Andrea Minetto, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini. Modeling Hot-Electron Trapping in GaN-based HEMTs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 10, IEEE, 2022. [doi]
@inproceedings{ModoloSMSSPMZM22,
title = {Modeling Hot-Electron Trapping in GaN-based HEMTs},
author = {Nicola Modolo and Carlo De Santi and Andrea Minetto and Luca Sayadi and Sebastien Sicre and Gerhard Prechtl and Gaudenzio Meneghesso and Enrico Zanoni and Matteo Meneghini},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764414},
url = {https://doi.org/10.1109/IRPS48227.2022.9764414},
researchr = {https://researchr.org/publication/ModoloSMSSPMZM22},
cites = {0},
citedby = {0},
pages = {10},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}