Peter Moens, Arno Stockman. A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{MoensS19,
title = {A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability},
author = {Peter Moens and Arno Stockman},
year = {2019},
doi = {10.1109/IRPS.2019.8720521},
url = {https://doi.org/10.1109/IRPS.2019.8720521},
researchr = {https://researchr.org/publication/MoensS19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}